4

at 4.2 and 77°K

Year:
1972
Language:
english
File:
PDF, 1.10 MB
english, 1972
5

Maskless fabrication of JFETs via focused ion beams

Year:
2004
Language:
english
File:
PDF, 302 KB
english, 2004
6

CMOS and post-CMOS on-chip microwave pulse power detectors

Year:
2006
Language:
english
File:
PDF, 354 KB
english, 2006
8

Shubnikov-de Hass Measurements in

Year:
1972
Language:
english
File:
PDF, 631 KB
english, 1972
27

Electron radiation damage and annealing of Hg1−xCdxTe at low temperatures

Year:
1973
Language:
english
File:
PDF, 574 KB
english, 1973
29

Materials Issues In X-Ray Mask Repair by Focused Ion Beams

Year:
1993
Language:
english
File:
PDF, 4.74 MB
english, 1993
33

Focused Ion Beam Induced Deposition

Year:
1989
Language:
english
File:
PDF, 2.29 MB
english, 1989